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CE Certified Thermal Shock Testing Machine Three Phase For Semiconductor Test

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CE Certified Thermal Shock Testing Machine Three Phase For Semiconductor Test

Brand Name : Neide

Model Number : ND-150

Certification : CE

Place of Origin : China

MOQ : 1 set

Price : Negotiable

Payment Terms : L/C,D/A,D/P,T/T,Western Union,MoneyGram

Supply Ability : 100sets/month

Delivery Time : 7-22 work days

Packaging Details : Wooden Box(standard export packaging)

Item : thermal shock chamber

Customized : Welcome

Factory : Yes

Customer : More than 500+

Material : SUS304 or customized

After-sales service : Yes

Transportation : By Sea

Reply for probme : Within 24 hours

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CE Certified Thermal Shock Chamber For Semiconductor Testing

Production Description:

The Thermal Shock Test Chamber represents a state - of - the - art testing instrument engineered to assess the robustness of material structures and composite materials subjected to rapid and consecutive transitions between elevated - temperature and cryogenic - temperature environments. This chamber facilitates the evaluation of materials within the most expedient time frame, ascertaining the magnitude of thermal expansion and contraction, along with any concomitant chemical alterations or physical impairments.

Specification:

Product Tags:

CE Certified Thermal Shock Testing Machine

      

Thermal Shock Testing Machine Three Phase

      

Semiconductor Test Thermal Shock Machine

      
Model

ND-42

(A~C)

ND-60

(A~C)

ND-80

(A~C)

ND-100

(A~C)

ND-120

(A~C)

ND-150

(A~C)
Inner size: WHD(cm) 40*30*35 50*30*40 50*40*40 50*50*40 60*40*50 60*50*50
External size: WHD(cm) 150*180*150 160*175*160 160*185*160 160*185*170 170*185*170 170*195*170
Temperature range(Test Chamber) high temperature:+60℃~+200℃;low temperature -10℃~-65℃(A:-45℃;B:-55℃;C:-65℃)
Heating Time RT~200℃ About 30min
Cooling Time RT~-70℃ About 85min
Temperature Conversion Time
China CE Certified Thermal Shock Testing Machine Three Phase For Semiconductor Test wholesale

CE Certified Thermal Shock Testing Machine Three Phase For Semiconductor Test Images

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